THE RELATIONSHIP BETWEEN TECHNOSTRESS AND BURNOUT AMONG DIFFERENT GENERATIONS
Loading...
Date
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
UNIVERSITI MALAYSIA SARAWAK
Abstract
Description
This study aims to identify the relationship between technostress and burnout among Generation X (Gen X) and Generation Z (Gen Z) employees in a selected multinational corporation located in Miri. Technostress refers to the stress experienced by individuals due to the use of information and communication technology (ICT), especially when they face techno-overload, techno-invasion, techno-complexity, techno-insecurity, and techno-uncertainty. Burnout is a psychological condition caused by long-term emotional exhaustion in the workplace. This study is based on the Transactional Theory of Stress and Coping, which explains how individuals appraise and cope with environmental demands. A quantitative approach was used, involving 78 respondents (39 from each generation) selected through purposive sampling. Data were collected using a structured questionnaire and analysed using Spearman’s correlation and the Mann-Whitney U test. The finding showed that all five technostress dimensions have a significant negative relationship with burnout. Gen X recorded higher technostress across all dimensions, while Gen Z reported higher burnout. This suggests that although Gen Z can adapt better to digital technology, they still face higher burnout because of constant connectivity. Meanwhile, Gen X tends to struggle more with technology itself but shows lower burnout. These results highlight the need for organisations to understand generational differences when addressing workplace technostress and employee well-being.